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An electrical characterisation methodology for identifying the switching mechanism in TiO(2) memristive stacks

Resistive random access memories (RRAMs) can be programmed to discrete resistive levels on demand via voltage pulses with appropriate amplitude and widths. This tuneability enables the design of various emerging concepts, to name a few: neuromorphic applications and reconfigurable circuits. Despite...

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Bibliografske podrobnosti
izdano v:Sci Rep
Main Authors: Michalas, L., Stathopoulos, S., Khiat, A., Prodromakis, T.
Format: Artigo
Jezik:Inglês
Izdano: Nature Publishing Group UK 2019
Teme:
Online dostop:https://ncbi.nlm.nih.gov/pmc/articles/PMC6546741/
https://ncbi.nlm.nih.gov/pubmed/31160619
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-019-44607-3
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