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Short range biaxial strain relief mechanism within epitaxially grown BiFeO(3)
Lattice mismatch-induced biaxial strain effect on the crystal structure and growth mechanism is investigated for the BiFeO(3) films grown on La(0.6)Sr(0.4)MnO(3)/SrTiO(3) and YAlO(3) substrates. Nano-beam electron diffraction, structure factor calculation and x-ray reciprocal space mapping unambiguo...
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| Izdano u: | Sci Rep |
|---|---|
| Glavni autori: | , , , , , , |
| Format: | Artigo |
| Jezik: | Inglês |
| Izdano: |
Nature Publishing Group UK
2019
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| Teme: | |
| Online pristup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6491549/ https://ncbi.nlm.nih.gov/pubmed/31040305 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-019-42998-x |
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