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Tensile stress effect on epitaxial BiFeO(3) thin film grown on KTaO(3)
Comprehensive crystal structural study is performed for BiFeO(3) (BFO) film grown on KTaO(3) (KTO) substrate using transmission electron microscopy (TEM) and x-ray diffraction (XRD). Nano-beam electron diffraction (NBED) combined with structure factor calculation and high resolution TEM images clear...
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| Publicado no: | Sci Rep |
|---|---|
| Main Authors: | , , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Nature Publishing Group UK
2018
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5772049/ https://ncbi.nlm.nih.gov/pubmed/29343784 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-018-19487-8 |
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