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Tensile stress effect on epitaxial BiFeO(3) thin film grown on KTaO(3)
Comprehensive crystal structural study is performed for BiFeO(3) (BFO) film grown on KTaO(3) (KTO) substrate using transmission electron microscopy (TEM) and x-ray diffraction (XRD). Nano-beam electron diffraction (NBED) combined with structure factor calculation and high resolution TEM images clear...
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| Gepubliceerd in: | Sci Rep |
|---|---|
| Hoofdauteurs: | , , , , , |
| Formaat: | Artigo |
| Taal: | Inglês |
| Gepubliceerd in: |
Nature Publishing Group UK
2018
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| Onderwerpen: | |
| Online toegang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5772049/ https://ncbi.nlm.nih.gov/pubmed/29343784 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-018-19487-8 |
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