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Tensile stress effect on epitaxial BiFeO(3) thin film grown on KTaO(3)

Comprehensive crystal structural study is performed for BiFeO(3) (BFO) film grown on KTaO(3) (KTO) substrate using transmission electron microscopy (TEM) and x-ray diffraction (XRD). Nano-beam electron diffraction (NBED) combined with structure factor calculation and high resolution TEM images clear...

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Bibliografische gegevens
Gepubliceerd in:Sci Rep
Hoofdauteurs: Bae, In-Tae, Ichinose, Tomohiro, Han, Myung-Geun, Zhu, Yimei, Yasui, Shintaro, Naganuma, Hiroshi
Formaat: Artigo
Taal:Inglês
Gepubliceerd in: Nature Publishing Group UK 2018
Onderwerpen:
Online toegang:https://ncbi.nlm.nih.gov/pmc/articles/PMC5772049/
https://ncbi.nlm.nih.gov/pubmed/29343784
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-018-19487-8
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