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Elucidation of crystal and electronic structures within highly strained BiFeO(3) by transmission electron microscopy and first-principles simulation
Crystal and electronic structures of ~380 nm BiFeO(3) film grown on LaAlO(3) substrate are comprehensively studied using advanced transmission electron microscopy (TEM) technique combined with first-principles theory. Cross-sectional TEM images reveal the BiFeO(3) film consists of two zones with dif...
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| Vydáno v: | Sci Rep |
|---|---|
| Hlavní autoři: | , , , , , , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
Nature Publishing Group
2017
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5395957/ https://ncbi.nlm.nih.gov/pubmed/28422150 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep46498 |
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