טוען...
Thickness scaling of ferroelectricity in BiFeO(3) by tomographic atomic force microscopy
Nanometer-scale 3D imaging of materials properties is critical for understanding equilibrium states in electronic materials, as well as for optimization of device performance and reliability, even though such capabilities remain a substantial experimental challenge. Tomographic atomic force microsco...
שמור ב:
| הוצא לאור ב: | Proc Natl Acad Sci U S A |
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| Main Authors: | , , , |
| פורמט: | Artigo |
| שפה: | Inglês |
| יצא לאור: |
National Academy of Sciences
2019
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| נושאים: | |
| גישה מקוונת: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6377454/ https://ncbi.nlm.nih.gov/pubmed/30683718 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1073/pnas.1806074116 |
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