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Photo-Induced Force Microscopy by Using Quartz Tuning-Fork Sensor
We present the photo-induced force microscopy (PiFM) studies of various nano-materials by implementing a quartz tuning fork (QTF), a self-sensing sensor that does not require complex optics to detect the motion of a force probe and thus helps to compactly configure the nanoscale optical mapping tool...
Gorde:
| Argitaratua izan da: | Sensors (Basel) |
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| Egile Nagusiak: | , , |
| Formatua: | Artigo |
| Hizkuntza: | Inglês |
| Argitaratua: |
MDPI
2019
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| Gaiak: | |
| Sarrera elektronikoa: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6480011/ https://ncbi.nlm.nih.gov/pubmed/30934843 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s19071530 |
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