Φορτώνει......
Photo-Induced Force Microscopy by Using Quartz Tuning-Fork Sensor
We present the photo-induced force microscopy (PiFM) studies of various nano-materials by implementing a quartz tuning fork (QTF), a self-sensing sensor that does not require complex optics to detect the motion of a force probe and thus helps to compactly configure the nanoscale optical mapping tool...
Αποθηκεύτηκε σε:
| Τόπος έκδοσης: | Sensors (Basel) |
|---|---|
| Κύριοι συγγραφείς: | , , |
| Μορφή: | Artigo |
| Γλώσσα: | Inglês |
| Έκδοση: |
MDPI
2019
|
| Θέματα: | |
| Διαθέσιμο Online: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6480011/ https://ncbi.nlm.nih.gov/pubmed/30934843 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s19071530 |
| Ετικέτες: |
Προσθήκη ετικέτας
Δεν υπάρχουν, Καταχωρήστε ετικέτα πρώτοι!
|