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Challenges to miniaturizing cold atom technology for deployable vacuum metrology
Cold atoms are excellent metrological tools; they currently realize SI time and, soon, SI pressure in the ultra-high (UHV) and extreme high vacuum (XHV) regimes. The development of primary, vacuum metrology based on cold atoms currently falls under the purview of national metrology institutes. Under...
Tallennettuna:
| Julkaisussa: | Metrologia |
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| Päätekijät: | , , , , , , , |
| Aineistotyyppi: | Artigo |
| Kieli: | Inglês |
| Julkaistu: |
2018
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| Aiheet: | |
| Linkit: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6459404/ https://ncbi.nlm.nih.gov/pubmed/30983635 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1088/1681-7575/aadbe4 |
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