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Challenges to miniaturizing cold atom technology for deployable vacuum metrology

Cold atoms are excellent metrological tools; they currently realize SI time and, soon, SI pressure in the ultra-high (UHV) and extreme high vacuum (XHV) regimes. The development of primary, vacuum metrology based on cold atoms currently falls under the purview of national metrology institutes. Under...

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Detalhes bibliográficos
Publicado no:Metrologia
Main Authors: Eckel, Stephen, Barker, Daniel S., Fedchak, James A., Klimov, Nikolai N., Norrgard, Eric, Scherschligt, Julia, Makrides, Constantinos, Tiesinga, Eite
Formato: Artigo
Idioma:Inglês
Publicado em: 2018
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC6459404/
https://ncbi.nlm.nih.gov/pubmed/30983635
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1088/1681-7575/aadbe4
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