Načítá se...
Challenges to miniaturizing cold atom technology for deployable vacuum metrology
Cold atoms are excellent metrological tools; they currently realize SI time and, soon, SI pressure in the ultra-high (UHV) and extreme high vacuum (XHV) regimes. The development of primary, vacuum metrology based on cold atoms currently falls under the purview of national metrology institutes. Under...
Uloženo v:
| Vydáno v: | Metrologia |
|---|---|
| Hlavní autoři: | , , , , , , , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
2018
|
| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6459404/ https://ncbi.nlm.nih.gov/pubmed/30983635 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1088/1681-7575/aadbe4 |
| Tagy: |
Přidat tag
Žádné tagy, Buďte první, kdo otaguje tento záznam!
|