Indexing grazing-incidence X-ray diffraction patterns of thin films: lattices of higher symmetry

Grazing-incidence X-ray diffraction studies on organic thin films are often performed on systems showing fibre-textured growth. However, indexing their experimental diffraction patterns is generally challenging, especially if low-symmetry lattices are involved. Recently, analytical mathematical expr...

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Gorde:
Xehetasun bibliografikoak
Argitaratua izan da:J Appl Crystallogr
Egile Nagusiak: Simbrunner, Josef, Hofer, Sebastian, Schrode, Benedikt, Garmshausen, Yves, Hecht, Stefan, Resel, Roland, Salzmann, Ingo
Formatua: Artigo
Hizkuntza:Inglês
Argitaratua: International Union of Crystallography 2019
Gaiak:
Research Papers
Sarrera elektronikoa:https://ncbi.nlm.nih.gov/pmc/articles/PMC6448685/
https://ncbi.nlm.nih.gov/pubmed/30996719
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600576719003029
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