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An efficient method for indexing grazing-incidence X-ray diffraction data of epitaxially grown thin films
Crystal structure identification of thin organic films entails a number of technical and methodological challenges. In particular, if molecular crystals are epitaxially grown on single-crystalline substrates a complex scenario of multiple preferred orientations of the adsorbate, several symmetry-rel...
Guardat en:
| Publicat a: | Acta Crystallogr A Found Adv |
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| Autors principals: | , , , , , |
| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
International Union of Crystallography
2020
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| Matèries: | |
| Accés en línia: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7233012/ https://ncbi.nlm.nih.gov/pubmed/32356785 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S2053273320001266 |
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