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An efficient method for indexing grazing-incidence X-ray diffraction data of epitaxially grown thin films

Crystal structure identification of thin organic films entails a number of technical and methodological challenges. In particular, if molecular crystals are epitaxially grown on single-crystalline substrates a complex scenario of multiple preferred orientations of the adsorbate, several symmetry-rel...

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Detalhes bibliográficos
Publicado no:Acta Crystallogr A Found Adv
Main Authors: Simbrunner, Josef, Schrode, Benedikt, Domke, Jari, Fritz, Torsten, Salzmann, Ingo, Resel, Roland
Formato: Artigo
Idioma:Inglês
Publicado em: International Union of Crystallography 2020
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC7233012/
https://ncbi.nlm.nih.gov/pubmed/32356785
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S2053273320001266
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