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Indexing grazing-incidence X-ray diffraction patterns of thin films: lattices of higher symmetry
Grazing-incidence X-ray diffraction studies on organic thin films are often performed on systems showing fibre-textured growth. However, indexing their experimental diffraction patterns is generally challenging, especially if low-symmetry lattices are involved. Recently, analytical mathematical expr...
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| Publicado en: | J Appl Crystallogr |
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| Autores principales: | , , , , , , |
| Formato: | Artigo |
| Lenguaje: | Inglês |
| Publicado: |
International Union of Crystallography
2019
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| Materias: | |
| Acceso en línea: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6448685/ https://ncbi.nlm.nih.gov/pubmed/30996719 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600576719003029 |
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