Resolving 500 nm axial separation by multi-slice X-ray ptychography

Multi-slice X-ray ptychography offers an approach to achieve images with a nanometre-scale resolution from samples with thicknesses larger than the depth of field of the imaging system by modeling a thick sample as a set of thin slices and accounting for the wavefront propagation effects within the...

Deskribapen osoa

Gorde:
Xehetasun bibliografikoak
Argitaratua izan da:Acta Crystallogr A Found Adv
Egile Nagusiak: Huang, Xiaojing, Yan, Hanfei, He, Yan, Ge, Mingyuan, Öztürk, Hande, Fang, Yao-Lung L., Ha, Sungsoo, Lin, Meifeng, Lu, Ming, Nazaretski, Evgeny, Robinson, Ian K., Chu, Yong S.
Formatua: Artigo
Hizkuntza:Inglês
Argitaratua: International Union of Crystallography 2019
Gaiak:
Research Papers
Sarrera elektronikoa:https://ncbi.nlm.nih.gov/pmc/articles/PMC6396394/
https://ncbi.nlm.nih.gov/pubmed/30821266
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S2053273318017229
Etiketak: Etiketa erantsi
Etiketarik gabe, Izan zaitez lehena erregistro honi etiketa jartzen!

Antzeko izenburuak