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Resolving 500 nm axial separation by multi-slice X-ray ptychography
Multi-slice X-ray ptychography offers an approach to achieve images with a nanometre-scale resolution from samples with thicknesses larger than the depth of field of the imaging system by modeling a thick sample as a set of thin slices and accounting for the wavefront propagation effects within the...
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| Vydáno v: | Acta Crystallogr A Found Adv |
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| Hlavní autoři: | , , , , , , , , , , , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
International Union of Crystallography
2019
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6396394/ https://ncbi.nlm.nih.gov/pubmed/30821266 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S2053273318017229 |
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