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11 nm hard X-ray focus from a large-aperture multilayer Laue lens
The focusing performance of a multilayer Laue lens (MLL) with 43.4 μm aperture, 4 nm finest zone width and 4.2 mm focal length at 12 keV was characterized with X-rays using ptychography method. The reconstructed probe shows a full-width-at-half-maximum (FWHM) peak size of 11.2 nm. The obtained X-ray...
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Main Authors: | , , , , , , , , , , , , |
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Formáid: | Artigo |
Teanga: | Inglês |
Foilsithe: |
Nature Publishing Group
2013
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Ábhair: | |
Rochtain Ar Líne: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3868962/ https://ncbi.nlm.nih.gov/pubmed/24356395 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep03562 |
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