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Multi-slice ptychography enables high-resolution measurements in extended chemical reactors
Ptychographic X-ray microscopy is an ideal tool to observe chemical processes under in situ conditions. Chemical reactors, however, are often thicker than the depth of field, limiting the lateral spatial resolution in projection images. To overcome this limit and reach higher lateral spatial resolut...
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| Publicado no: | Sci Rep |
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| Main Authors: | , , , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Nature Publishing Group UK
2021
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7810740/ https://ncbi.nlm.nih.gov/pubmed/33452343 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-020-80926-6 |
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