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Multi-slice ptychography enables high-resolution measurements in extended chemical reactors
Ptychographic X-ray microscopy is an ideal tool to observe chemical processes under in situ conditions. Chemical reactors, however, are often thicker than the depth of field, limiting the lateral spatial resolution in projection images. To overcome this limit and reach higher lateral spatial resolut...
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| Yayımlandı: | Sci Rep |
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| Asıl Yazarlar: | , , , , , , |
| Materyal Türü: | Artigo |
| Dil: | Inglês |
| Baskı/Yayın Bilgisi: |
Nature Publishing Group UK
2021
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| Konular: | |
| Online Erişim: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7810740/ https://ncbi.nlm.nih.gov/pubmed/33452343 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-020-80926-6 |
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