Kahnt, M., Grote, L., Brückner, D., Seyrich, M., Wittwer, F., Koziej, D., & Schroer, C. G. (2021). Multi-slice ptychography enables high-resolution measurements in extended chemical reactors. Sci Rep.
Chicago Style aipamenaKahnt, Maik, Lukas Grote, Dennis Brückner, Martin Seyrich, Felix Wittwer, Dorota Koziej, and Christian G. Schroer. "Multi-slice Ptychography Enables High-resolution Measurements in Extended Chemical Reactors." Sci Rep 2021.
MLA aipamenaKahnt, Maik, et al. "Multi-slice Ptychography Enables High-resolution Measurements in Extended Chemical Reactors." Sci Rep 2021.
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