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Atomic number dependence of Z contrast in scanning transmission electron microscopy
Annular dark-field (ADF) imaging by scanning transmission electron microscopy (STEM) is a common technique for material characterization with high spatial resolution. It has been reported that ADF signal is proportional to the nth power of the atomic number Z, i.e., the Z contrast in textbooks and p...
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| 出版年: | Sci Rep |
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| 主要な著者: | , , , , , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
Nature Publishing Group UK
2018
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6098135/ https://ncbi.nlm.nih.gov/pubmed/30120323 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-018-30941-5 |
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