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Quantitative annular dark-field imaging of single-layer graphene—II: atomic-resolution image contrast

We have investigated how accurately atomic-resolution annular dark-field (ADF) images match between experiments and simulations to conduct more reliable crystal structure analyses. Quantitative ADF imaging, in which the ADF intensity at each pixel represents the fraction of the incident probe curren...

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Detalhes bibliográficos
Publicado no:Microscopy (Oxf)
Main Authors: Yamashita, Shunsuke, Koshiya, Shogo, Nagai, Takuro, Kikkawa, Jun, Ishizuka, Kazuo, Kimoto, Koji
Formato: Artigo
Idioma:Inglês
Publicado em: Oxford University Press 2015
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC4711290/
https://ncbi.nlm.nih.gov/pubmed/26347577
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1093/jmicro/dfv053
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