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Quantitative annular dark-field imaging of single-layer graphene—II: atomic-resolution image contrast

We have investigated how accurately atomic-resolution annular dark-field (ADF) images match between experiments and simulations to conduct more reliable crystal structure analyses. Quantitative ADF imaging, in which the ADF intensity at each pixel represents the fraction of the incident probe curren...

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Bibliografiske detaljer
Udgivet i:Microscopy (Oxf)
Main Authors: Yamashita, Shunsuke, Koshiya, Shogo, Nagai, Takuro, Kikkawa, Jun, Ishizuka, Kazuo, Kimoto, Koji
Format: Artigo
Sprog:Inglês
Udgivet: Oxford University Press 2015
Fag:
Online adgang:https://ncbi.nlm.nih.gov/pmc/articles/PMC4711290/
https://ncbi.nlm.nih.gov/pubmed/26347577
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1093/jmicro/dfv053
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