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Quantitative annular dark-field imaging of single-layer graphene—II: atomic-resolution image contrast

We have investigated how accurately atomic-resolution annular dark-field (ADF) images match between experiments and simulations to conduct more reliable crystal structure analyses. Quantitative ADF imaging, in which the ADF intensity at each pixel represents the fraction of the incident probe curren...

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Dettagli Bibliografici
Pubblicato in:Microscopy (Oxf)
Autori principali: Yamashita, Shunsuke, Koshiya, Shogo, Nagai, Takuro, Kikkawa, Jun, Ishizuka, Kazuo, Kimoto, Koji
Natura: Artigo
Lingua:Inglês
Pubblicazione: Oxford University Press 2015
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Accesso online:https://ncbi.nlm.nih.gov/pmc/articles/PMC4711290/
https://ncbi.nlm.nih.gov/pubmed/26347577
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1093/jmicro/dfv053
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