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Atomic number dependence of Z contrast in scanning transmission electron microscopy
Annular dark-field (ADF) imaging by scanning transmission electron microscopy (STEM) is a common technique for material characterization with high spatial resolution. It has been reported that ADF signal is proportional to the nth power of the atomic number Z, i.e., the Z contrast in textbooks and p...
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| Publicado no: | Sci Rep |
|---|---|
| Main Authors: | , , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Nature Publishing Group UK
2018
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6098135/ https://ncbi.nlm.nih.gov/pubmed/30120323 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-018-30941-5 |
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