Atomic number dependence of Z contrast in scanning transmission electron microscopy

Annular dark-field (ADF) imaging by scanning transmission electron microscopy (STEM) is a common technique for material characterization with high spatial resolution. It has been reported that ADF signal is proportional to the nth power of the atomic number Z, i.e., the Z contrast in textbooks and p...

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發表在:Sci Rep
Main Authors: Yamashita, Shunsuke, Kikkawa, Jun, Yanagisawa, Keiichi, Nagai, Takuro, Ishizuka, Kazuo, Kimoto, Koji
格式: Artigo
語言:Inglês
出版: Nature Publishing Group UK 2018
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Article
在線閱讀:https://ncbi.nlm.nih.gov/pmc/articles/PMC6098135/
https://ncbi.nlm.nih.gov/pubmed/30120323
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-018-30941-5
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