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Phase contrast scanning transmission electron microscopy imaging of light and heavy atoms at the limit of contrast and resolution
Using state of the art scanning transmission electron microscopy (STEM) it is nowadays possible to directly image single atomic columns at sub-Å resolution. In standard (high angle) annular dark field STEM ((HA)ADF-STEM), however, light elements are usually invisible when imaged together with heavie...
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| Publicado no: | Sci Rep |
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| Main Authors: | , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Nature Publishing Group UK
2018
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5805791/ https://ncbi.nlm.nih.gov/pubmed/29422551 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-018-20377-2 |
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