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Quantitative annular dark-field imaging of single-layer graphene—II: atomic-resolution image contrast

We have investigated how accurately atomic-resolution annular dark-field (ADF) images match between experiments and simulations to conduct more reliable crystal structure analyses. Quantitative ADF imaging, in which the ADF intensity at each pixel represents the fraction of the incident probe curren...

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Detaylı Bibliyografya
Yayımlandı:Microscopy (Oxf)
Asıl Yazarlar: Yamashita, Shunsuke, Koshiya, Shogo, Nagai, Takuro, Kikkawa, Jun, Ishizuka, Kazuo, Kimoto, Koji
Materyal Türü: Artigo
Dil:Inglês
Baskı/Yayın Bilgisi: Oxford University Press 2015
Konular:
Online Erişim:https://ncbi.nlm.nih.gov/pmc/articles/PMC4711290/
https://ncbi.nlm.nih.gov/pubmed/26347577
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1093/jmicro/dfv053
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