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Structural determination of bilayer graphene on SiC(0001) using synchrotron radiation photoelectron diffraction
In recent years there has been growing interest in the electronic properties of ‘few layer’ graphene films. Twisted layers, different stacking and register with the substrate result in remarkable unconventional couplings. These distinctive electronic behaviours have been attributed to structural dif...
Gorde:
| Argitaratua izan da: | Sci Rep |
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| Egile Nagusiak: | , , , , , , |
| Formatua: | Artigo |
| Hizkuntza: | Inglês |
| Argitaratua: |
Nature Publishing Group UK
2018
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| Gaiak: | |
| Sarrera elektronikoa: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6033894/ https://ncbi.nlm.nih.gov/pubmed/29976962 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-018-28402-0 |
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