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Structural determination of bilayer graphene on SiC(0001) using synchrotron radiation photoelectron diffraction
In recent years there has been growing interest in the electronic properties of ‘few layer’ graphene films. Twisted layers, different stacking and register with the substrate result in remarkable unconventional couplings. These distinctive electronic behaviours have been attributed to structural dif...
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| Publicado no: | Sci Rep |
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| Main Authors: | , , , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Nature Publishing Group UK
2018
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6033894/ https://ncbi.nlm.nih.gov/pubmed/29976962 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-018-28402-0 |
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