A carregar...
Know your full potential: Quantitative Kelvin probe force microscopy on nanoscale electrical devices
In this study we investigate the influence of the operation method in Kelvin probe force microscopy (KPFM) on the measured potential distribution. KPFM is widely used to map the nanoscale potential distribution in operating devices, e.g., in thin film transistors or on cross sections of functional s...
Na minha lista:
| Publicado no: | Beilstein J Nanotechnol |
|---|---|
| Main Authors: | , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Beilstein-Institut
2018
|
| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6009372/ https://ncbi.nlm.nih.gov/pubmed/29977714 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.9.172 |
| Tags: |
Adicionar Tag
Sem tags, seja o primeiro a adicionar uma tag!
|