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Electronic states of deep trap levels in a-plane GaN templates grown on r-plane sapphire by HVPE

We report on the defect states incorporated in a-plane GaN crystals grown on r-plane sapphire substrates by hydride vapor phase epitaxy (HVPE), using deep level transient spectroscopy (DLTS). Two defect states were observed at 0.2 eV and 0.55 eV below the conduction band minimum with defect densitie...

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Detalhes bibliográficos
Publicado no:Sci Rep
Main Authors: Lee, Moonsang, Vu, Thi Kim Oanh, Lee, Kyoung Su, Kim, Eun Kyu, Park, Sungsoo
Formato: Artigo
Idioma:Inglês
Publicado em: Nature Publishing Group UK 2018
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC5959929/
https://ncbi.nlm.nih.gov/pubmed/29777185
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-018-26290-y
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