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Electronic states of deep trap levels in a-plane GaN templates grown on r-plane sapphire by HVPE

We report on the defect states incorporated in a-plane GaN crystals grown on r-plane sapphire substrates by hydride vapor phase epitaxy (HVPE), using deep level transient spectroscopy (DLTS). Two defect states were observed at 0.2 eV and 0.55 eV below the conduction band minimum with defect densitie...

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書目詳細資料
發表在:Sci Rep
Main Authors: Lee, Moonsang, Vu, Thi Kim Oanh, Lee, Kyoung Su, Kim, Eun Kyu, Park, Sungsoo
格式: Artigo
語言:Inglês
出版: Nature Publishing Group UK 2018
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在線閱讀:https://ncbi.nlm.nih.gov/pmc/articles/PMC5959929/
https://ncbi.nlm.nih.gov/pubmed/29777185
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-018-26290-y
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