Low-Temperature Reduction of Graphene Oxide: Electrical Conductance and Scanning Kelvin Probe Force Microscopy

Graphene oxide (GO) films were formed by drop-casting method and were studied by FTIR spectroscopy, micro-Raman spectroscopy (mRS), X-ray photoelectron spectroscopy (XPS), four-points probe method, atomic force microscopy (AFM), and scanning Kelvin probe force (SKPFM) microscopy after low-temperatur...

Deskribapen osoa

Gorde:
Xehetasun bibliografikoak
Argitaratua izan da:Nanoscale Res Lett
Egile Nagusiak: Slobodian, Oleksandr M., Lytvyn, Peter M., Nikolenko, Andrii S., Naseka, Victor M., Khyzhun, Oleg Yu., Vasin, Andrey V., Sevostianov, Stanislav V., Nazarov, Alexei N.
Formatua: Artigo
Hizkuntza:Inglês
Argitaratua: Springer US 2018
Gaiak:
Nano Express
Sarrera elektronikoa:https://ncbi.nlm.nih.gov/pmc/articles/PMC5940978/
https://ncbi.nlm.nih.gov/pubmed/29740776
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s11671-018-2536-z
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