Low-Temperature Reduction of Graphene Oxide: Electrical Conductance and Scanning Kelvin Probe Force Microscopy

Graphene oxide (GO) films were formed by drop-casting method and were studied by FTIR spectroscopy, micro-Raman spectroscopy (mRS), X-ray photoelectron spectroscopy (XPS), four-points probe method, atomic force microscopy (AFM), and scanning Kelvin probe force (SKPFM) microscopy after low-temperatur...

ver descrição completa

Na minha lista:
Detalhes bibliográficos
Publicado no:Nanoscale Res Lett
Main Authors: Slobodian, Oleksandr M., Lytvyn, Peter M., Nikolenko, Andrii S., Naseka, Victor M., Khyzhun, Oleg Yu., Vasin, Andrey V., Sevostianov, Stanislav V., Nazarov, Alexei N.
Formato: Artigo
Idioma:Inglês
Publicado em: Springer US 2018
Assuntos:
Nano Express
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC5940978/
https://ncbi.nlm.nih.gov/pubmed/29740776
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s11671-018-2536-z
Tags: Adicionar Tag
Sem tags, seja o primeiro a adicionar uma tag!

Registos relacionados