Direct Determination of 3D Distribution of Elemental Composition in Single Semiconductor Nanoislands by Scanning Auger Microscopy

Por Ponomaryov, Semyon S., Yukhymchuk, Volodymyr O., Lytvyn, Peter M., Valakh, Mykhailo Ya
Publicado no Nanoscale Res Lett (2016)

Low-Temperature Reduction of Graphene Oxide: Electrical Conductance and Scanning Kelvin Probe Force Microscopy

Por Slobodian, Oleksandr M., Lytvyn, Peter M., Nikolenko, Andrii S., Naseka, Victor M., Khyzhun, Oleg Yu., Vasin, Andrey V., Sevostianov, Stanislav V., Nazarov, Alexei N.
Publicado no Nanoscale Res Lett (2018)