Low-Temperature Reduction of Graphene Oxide: Electrical Conductance and Scanning Kelvin Probe Force Microscopy

Graphene oxide (GO) films were formed by drop-casting method and were studied by FTIR spectroscopy, micro-Raman spectroscopy (mRS), X-ray photoelectron spectroscopy (XPS), four-points probe method, atomic force microscopy (AFM), and scanning Kelvin probe force (SKPFM) microscopy after low-temperatur...

Täydet tiedot

Tallennettuna:
Bibliografiset tiedot
Julkaisussa:Nanoscale Res Lett
Päätekijät: Slobodian, Oleksandr M., Lytvyn, Peter M., Nikolenko, Andrii S., Naseka, Victor M., Khyzhun, Oleg Yu., Vasin, Andrey V., Sevostianov, Stanislav V., Nazarov, Alexei N.
Aineistotyyppi: Artigo
Kieli:Inglês
Julkaistu: Springer US 2018
Aiheet:
Nano Express
Linkit:https://ncbi.nlm.nih.gov/pmc/articles/PMC5940978/
https://ncbi.nlm.nih.gov/pubmed/29740776
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s11671-018-2536-z
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