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Combined scanning probe electronic and thermal characterization of an indium arsenide nanowire
As electronic devices are downsized, physical processes at the interface to electrodes may dominate and limit device performance. A crucial step towards device optimization is being able to separate such contact effects from intrinsic device properties. Likewise, an increased local temperature due t...
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| 出版年: | Beilstein J Nanotechnol |
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| 主要な著者: | , , , , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
Beilstein-Institut
2018
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5789438/ https://ncbi.nlm.nih.gov/pubmed/29441258 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.9.15 |
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