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Improved Linearity with Polarization Coulomb Field Scattering in AlGaN/GaN Heterostructure Field-Effect Transistors

The single-tone power of the AlGaN/GaN heterostructure field-effect transistors (HFETs) with different gate widths was measured. A distinct improvement in device linearity was observed in the sample with a larger gate width. The analysis of the variation of the parasitic source access resistance sho...

詳細記述

保存先:
書誌詳細
出版年:Sci Rep
主要な著者: Cui, Peng, Lv, Yuanjie, Liu, Huan, Cheng, Aijie, Fu, Chen, Lin, Zhaojun
フォーマット: Artigo
言語:Inglês
出版事項: Nature Publishing Group UK 2018
主題:
オンライン・アクセス:https://ncbi.nlm.nih.gov/pmc/articles/PMC5772463/
https://ncbi.nlm.nih.gov/pubmed/29343744
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-018-19510-y
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