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Probing spatial heterogeneity in silicon thin films by Raman spectroscopy
Raman spectroscopy is a powerful technique for revealing spatial heterogeneity in solid-state structures but heretofore has not been able to measure spectra from multiple positions on a sample within a short time. Here, we report a novel Raman spectroscopy approach to study the spatial heterogeneity...
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| Vydáno v: | Sci Rep |
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| Hlavní autoři: | , , , , , , , , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
Nature Publishing Group UK
2017
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5707398/ https://ncbi.nlm.nih.gov/pubmed/29185465 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-017-16724-4 |
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