Probing spatial heterogeneity in silicon thin films by Raman spectroscopy

Raman spectroscopy is a powerful technique for revealing spatial heterogeneity in solid-state structures but heretofore has not been able to measure spectra from multiple positions on a sample within a short time. Here, we report a novel Raman spectroscopy approach to study the spatial heterogeneity...

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Bibliografiske detaljer
Udgivet i:Sci Rep
Main Authors: Yamazaki, Hideyuki, Koike, Mitsuo, Saitoh, Masumi, Tomita, Mitsuhiro, Yokogawa, Ryo, Sawamoto, Naomi, Tomita, Motohiro, Kosemura, Daisuke, Ogura, Atsushi
Format: Artigo
Sprog:Inglês
Udgivet: Nature Publishing Group UK 2017
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Article
Online adgang:https://ncbi.nlm.nih.gov/pmc/articles/PMC5707398/
https://ncbi.nlm.nih.gov/pubmed/29185465
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-017-16724-4
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