טוען...
Tip-Enhanced Raman Imaging and Nano Spectroscopy of Etched Silicon Nanowires
Tip-enhanced Raman spectroscopy (TERS) is used to investigate the influence of strains in isolated and overlapping silicon nanowires prepared by chemical etching of a (100) silicon wafer. An atomic force microscopy tip made of nanocrystalline diamond coated with a thin layer of silver is used in con...
שמור ב:
| Main Authors: | , , , , |
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| פורמט: | Artigo |
| שפה: | Inglês |
| יצא לאור: |
Molecular Diversity Preservation International (MDPI)
2013
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| נושאים: | |
| גישה מקוונת: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3859034/ https://ncbi.nlm.nih.gov/pubmed/24072021 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s131012744 |
| תגים: |
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