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Quantitative Scanning Probe Microscopy for Nanomechanical Forensics

Atomic force microscopy (AFM) was used to assess the indentation modulus M(s) and pull-off force F(po) in four case studies of distinct evidence types, namely hair, questioned documents, fingerprints, and explosive particle-surface interactions. In the hair study, M(s) decreased and F(po) increased...

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Shranjeno v:
Bibliografske podrobnosti
izdano v:Exp Mech
Main Authors: DelRio, F.W., Cook, R.F.
Format: Artigo
Jezik:Inglês
Izdano: 2016
Teme:
Online dostop:https://ncbi.nlm.nih.gov/pmc/articles/PMC5647587/
https://ncbi.nlm.nih.gov/pubmed/29056752
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1007/s11340-016-0238-y
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