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Quantitative Scanning Probe Microscopy for Nanomechanical Forensics
Atomic force microscopy (AFM) was used to assess the indentation modulus M(s) and pull-off force F(po) in four case studies of distinct evidence types, namely hair, questioned documents, fingerprints, and explosive particle-surface interactions. In the hair study, M(s) decreased and F(po) increased...
Αποθηκεύτηκε σε:
| Τόπος έκδοσης: | Exp Mech |
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| Κύριοι συγγραφείς: | , |
| Μορφή: | Artigo |
| Γλώσσα: | Inglês |
| Έκδοση: |
2016
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| Θέματα: | |
| Διαθέσιμο Online: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5647587/ https://ncbi.nlm.nih.gov/pubmed/29056752 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1007/s11340-016-0238-y |
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