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Oxygen Partial Pressure Impact on Characteristics of Indium Titanium Zinc Oxide Thin Film Transistor Fabricated via RF Sputtering

Indium titanium zinc oxide (InTiZnO) as the channel layer in thin film transistor (TFT) grown by RF sputtering system is proposed in this work. Optical and electrical properties were investigated. By changing the oxygen flow ratio, we can suppress excess and undesirable oxygen-related defects to som...

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Detalhes bibliográficos
Publicado no:Nanomaterials (Basel)
Main Authors: Hsu, Ming-Hung, Chang, Sheng-Po, Chang, Shoou-Jinn, Wu, Wei-Ting, Li, Jyun-Yi
Formato: Artigo
Idioma:Inglês
Publicado em: MDPI 2017
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC5535222/
https://ncbi.nlm.nih.gov/pubmed/28672868
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/nano7070156
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