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Does Your SEM Really Tell the Truth?—How Would You Know? Part 4: Charging and its Mitigation
This is the fourth part of a series of tutorial papers discussing various causes of measurement uncertainty in scanned particle beam instruments, and some of the solutions researched and developed at NIST and other research institutions. Scanned particle beam instruments, especially the scanning ele...
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| 出版年: | Proc SPIE Int Soc Opt Eng |
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| 主要な著者: | , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
2015
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5486231/ https://ncbi.nlm.nih.gov/pubmed/28663665 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1117/12.2195344 |
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