Deceleration of probe beam by stage bias potential improves resolution of serial block-face scanning electron microscopic images

Serial block-face scanning electron microscopy (SBEM) is quickly becoming an important imaging tool to explore three-dimensional biological structure across spatial scales. At probe-beam-electron energies of 2.0 keV or lower, the axial resolution should improve, because there is less primary electro...

Täydet tiedot

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Bibliografiset tiedot
Julkaisussa:Adv Struct Chem Imaging
Päätekijät: Bouwer, James C., Deerinck, Thomas J., Bushong, Eric, Astakhov, Vadim, Ramachandra, Ranjan, Peltier, Steven T., Ellisman, Mark H.
Aineistotyyppi: Artigo
Kieli:Inglês
Julkaistu: Springer International Publishing 2016
Aiheet:
Research
Linkit:https://ncbi.nlm.nih.gov/pmc/articles/PMC5025511/
https://ncbi.nlm.nih.gov/pubmed/27695667
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s40679-016-0025-y
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