Bouwer, J. C., Deerinck, T. J., Bushong, E., Astakhov, V., Ramachandra, R., Peltier, S. T., & Ellisman, M. H. (2016). Deceleration of probe beam by stage bias potential improves resolution of serial block-face scanning electron microscopic images. Adv Struct Chem Imaging.

Bouwer, James C., Thomas J. Deerinck, Eric Bushong, Vadim Astakhov, Ranjan Ramachandra, Steven T. Peltier, and Mark H. Ellisman. "Deceleration of Probe Beam By Stage Bias Potential Improves Resolution of Serial Block-face Scanning Electron Microscopic Images." Adv Struct Chem Imaging 2016.

Bouwer, James C., et al. "Deceleration of Probe Beam By Stage Bias Potential Improves Resolution of Serial Block-face Scanning Electron Microscopic Images." Adv Struct Chem Imaging 2016.