ロード中...
High-performance serial block-face SEM of non-conductive biological samples enabled by focal gas injection-based charge compensation
A longstanding limitation of imaging with serial block-face scanning electron microscopy is specimen surface charging. This charging is largely due to the difficulties in making biological specimens and the resins in which they are embedded sufficiently conductive. Local accumulation of charge on th...
保存先:
| 出版年: | J Microsc |
|---|---|
| 主要な著者: | , , , , , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
2017
|
| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5910240/ https://ncbi.nlm.nih.gov/pubmed/29194648 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1111/jmi.12667 |
| タグ: |
タグ追加
タグなし, このレコードへの初めてのタグを付けませんか!
|