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High-performance serial block-face SEM of non-conductive biological samples enabled by focal gas injection-based charge compensation

A longstanding limitation of imaging with serial block-face scanning electron microscopy is specimen surface charging. This charging is largely due to the difficulties in making biological specimens and the resins in which they are embedded sufficiently conductive. Local accumulation of charge on th...

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Dettagli Bibliografici
Pubblicato in:J Microsc
Autori principali: Deerinck, Thomas J., Shone, Tristan, Bushong, Eric A., Ramachandra, Ranjan, Peltier, Steven T., Ellisman, Mark H.
Natura: Artigo
Lingua:Inglês
Pubblicazione: 2017
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Accesso online:https://ncbi.nlm.nih.gov/pmc/articles/PMC5910240/
https://ncbi.nlm.nih.gov/pubmed/29194648
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1111/jmi.12667
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