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High-performance serial block-face SEM of non-conductive biological samples enabled by focal gas injection-based charge compensation

A longstanding limitation of imaging with serial block-face scanning electron microscopy is specimen surface charging. This charging is largely due to the difficulties in making biological specimens and the resins in which they are embedded sufficiently conductive. Local accumulation of charge on th...

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Detalhes bibliográficos
Publicado no:J Microsc
Main Authors: Deerinck, Thomas J., Shone, Tristan, Bushong, Eric A., Ramachandra, Ranjan, Peltier, Steven T., Ellisman, Mark H.
Formato: Artigo
Idioma:Inglês
Publicado em: 2017
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC5910240/
https://ncbi.nlm.nih.gov/pubmed/29194648
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1111/jmi.12667
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