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Focused-Ion-Beam-Milled Carbon Nanoelectrodes for Scanning Electrochemical Microscopy

Nanoscale scanning electrochemical microscopy (SECM) has emerged as a powerful electrochemical method that enables the study of interfacial reactions with unprecedentedly high spatial and kinetic resolution. In this work, we develop carbon nanoprobes with high electrochemical reactivity and well-con...

Deskribapen osoa

Gorde:
Xehetasun bibliografikoak
Argitaratua izan da:J Electrochem Soc
Egile Nagusiak: Chen, Ran, Hu, Keke, Yu, Yun, Mirkin, Michael V., Amemiya, Shigeru
Formatua: Artigo
Hizkuntza:Inglês
Argitaratua: 2016
Gaiak:
Sarrera elektronikoa:https://ncbi.nlm.nih.gov/pmc/articles/PMC5025261/
https://ncbi.nlm.nih.gov/pubmed/27642187
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1149/2.0071604jes
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