APA Alıntı

Chen, R., Hu, K., Yu, Y., Mirkin, M. V., & Amemiya, S. (2016). Focused-Ion-Beam-Milled Carbon Nanoelectrodes for Scanning Electrochemical Microscopy. J Electrochem Soc.

Chicago Stili Alıntı

Chen, Ran, Keke Hu, Yun Yu, Michael V. Mirkin, ve Shigeru Amemiya. "Focused-Ion-Beam-Milled Carbon Nanoelectrodes for Scanning Electrochemical Microscopy." J Electrochem Soc 2016.

MLA Alıntı

Chen, Ran, et al. "Focused-Ion-Beam-Milled Carbon Nanoelectrodes for Scanning Electrochemical Microscopy." J Electrochem Soc 2016.