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Focused-Ion-Beam-Milled Carbon Nanoelectrodes for Scanning Electrochemical Microscopy
Nanoscale scanning electrochemical microscopy (SECM) has emerged as a powerful electrochemical method that enables the study of interfacial reactions with unprecedentedly high spatial and kinetic resolution. In this work, we develop carbon nanoprobes with high electrochemical reactivity and well-con...
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| 出版年: | J Electrochem Soc |
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| 主要な著者: | , , , , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
2016
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5025261/ https://ncbi.nlm.nih.gov/pubmed/27642187 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1149/2.0071604jes |
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