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Use of XPS to Quantify Thickness of Coatings on Nanoparticles

XPS and other surface sensitive methods are being increasingly used to extract quantitative information about organic and inorganic coatings and contamination on nanoparticles. The extraction of coating thickness requires information about particle diameter from other measurements, such as electron...

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Detalhes bibliográficos
Publicado no:Micros Today
Main Authors: Baer, Donald R., Wang, Yung-Cheng, Castner, David G.
Formato: Artigo
Idioma:Inglês
Publicado em: 2016
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC5001563/
https://ncbi.nlm.nih.gov/pubmed/27574498
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1017/S1551929516000109
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