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Use of XPS to Quantify Thickness of Coatings on Nanoparticles
XPS and other surface sensitive methods are being increasingly used to extract quantitative information about organic and inorganic coatings and contamination on nanoparticles. The extraction of coating thickness requires information about particle diameter from other measurements, such as electron...
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| 出版年: | Micros Today |
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| 主要な著者: | , , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
2016
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5001563/ https://ncbi.nlm.nih.gov/pubmed/27574498 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1017/S1551929516000109 |
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