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Use of XPS to Quantify Thickness of Coatings on Nanoparticles
XPS and other surface sensitive methods are being increasingly used to extract quantitative information about organic and inorganic coatings and contamination on nanoparticles. The extraction of coating thickness requires information about particle diameter from other measurements, such as electron...
Wedi'i Gadw mewn:
| Cyhoeddwyd yn: | Micros Today |
|---|---|
| Prif Awduron: | , , |
| Fformat: | Artigo |
| Iaith: | Inglês |
| Cyhoeddwyd: |
2016
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| Pynciau: | |
| Mynediad Ar-lein: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5001563/ https://ncbi.nlm.nih.gov/pubmed/27574498 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1017/S1551929516000109 |
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