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Use of XPS to Quantify Thickness of Coatings on Nanoparticles

XPS and other surface sensitive methods are being increasingly used to extract quantitative information about organic and inorganic coatings and contamination on nanoparticles. The extraction of coating thickness requires information about particle diameter from other measurements, such as electron...

Täydet tiedot

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Bibliografiset tiedot
Julkaisussa:Micros Today
Päätekijät: Baer, Donald R., Wang, Yung-Cheng, Castner, David G.
Aineistotyyppi: Artigo
Kieli:Inglês
Julkaistu: 2016
Aiheet:
Linkit:https://ncbi.nlm.nih.gov/pmc/articles/PMC5001563/
https://ncbi.nlm.nih.gov/pubmed/27574498
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1017/S1551929516000109
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